Measurement of 0.35 microm laser imprint in a thin Si foil using an x-ray laser backlighter
Phys Rev Lett
.
1996 May 6;76(19):3574-3577.
doi: 10.1103/PhysRevLett.76.3574.
Authors
DH Kalantar
,
MH Key
,
LB DaSilva
,
SG Glendinning
,
JP Knauer
,
BA Remington
,
F Weber
,
SV Weber
PMID:
10061002
DOI:
10.1103/PhysRevLett.76.3574
No abstract available