The role of electron localization for resonant photoemission and Auger resonant Raman scattering to occur in an extended system was studied by polarization dependent resonant photoemission at the Cu L edges. Auger resonant Raman scattering was observed for continuum excitation into van Hove singularities at the L(1) and X(1) points, 4.2 and 7.7 eV above threshold. These findings show that resonant photoemission and Auger resonant Raman scattering are general features of photoemission independent of the degree of electron localization.