Abstract
Spectral and temporal characterization is a fundamental task when a tunable Ti:sapphire ultrafast laser system is operated for multiphoton microscopy applications. In the present paper simple procedures are reported that perform laser-peak-emission wavelength and bandwidth measurements without the need of any further instrumentation but a simple and inexpensive diffraction grating, by taking advantage of the confocal microscope imaging capabilities.
Publication types
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Comparative Study
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Evaluation Study
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Validation Study
MeSH terms
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Equipment Design
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Equipment Failure Analysis
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Image Enhancement / instrumentation*
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Image Enhancement / methods*
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Microscopy, Confocal / instrumentation*
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Microscopy, Confocal / methods*
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Microscopy, Fluorescence, Multiphoton / instrumentation*
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Microscopy, Fluorescence, Multiphoton / methods*
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Refractometry / instrumentation*
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Refractometry / statistics & numerical data*
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Reproducibility of Results
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Sensitivity and Specificity