Resolving conflicting crystallographic and NMR models for solution-state DNA with solution X-ray diffraction

Xiaobing Zuo; David M Tiede

doi:10.1021/ja044533+

Resolving conflicting crystallographic and NMR models for solution-state DNA with solution X-ray diffraction

J Am Chem Soc. 2005 Jan 12;127(1):16-7. doi: 10.1021/ja044533+.

Authors

Xiaobing Zuo¹, David M Tiede

Affiliation

¹ Chemistry Division, Argonne National Laboratory, 9700 South Cass Avenue, Argonne, Illinois 60439, USA.

PMID: 15631426
DOI: 10.1021/ja044533+

Abstract

We report on synchrotron-based high-angle X-ray solution scattering measured to 2 A resolution for two synthetic DNA sequences for which there are conflicting X-ray crystal and solution NMR models. Our results demonstrate that high-angle X-ray scattering discriminates between differing X-ray crystal and NMR models for solution-state DNA and provides a direct, independent method for testing structural models and measuring solution-state configurational dispersions.

Publication types

Research Support, U.S. Gov't, Non-P.H.S.

MeSH terms

Crystallography, X-Ray
DNA / chemistry*
Models, Molecular
Nuclear Magnetic Resonance, Biomolecular
Nucleic Acid Conformation
Solutions
X-Ray Diffraction

Substances

Solutions
DNA