[Direct determination of trace elements in tungsten products with ICP-AES]

Guang Pu Xue Yu Guang Pu Fen Xi. 1998 Oct;18(5):576-9.
[Article in Chinese]

Abstract

A direct determination of Al, As, Ca, Cd, Co, Cr, Cu, Fe, Mg, Mn, Mo, Ni, Sn, Ti and V in tungsten products with ICP-AES is presented. The influence of tungsten matrix is studied. Based on the selected optimum operating parameters, the feasibility of the proposed method is evaluated by analyzing three WO3 National References. The results are satisfactory.

Publication types

  • English Abstract