Modeling of the damage dynamics of nanospheres exposed to x-ray free-electron-laser radiation

Phys Rev E Stat Nonlin Soft Matter Phys. 2008 Apr;77(4 Pt 1):041902. doi: 10.1103/PhysRevE.77.041902. Epub 2008 Apr 1.

Abstract

Atomic-resolution diffraction imaging of biological particles using x-ray free-electron lasers (XFELs) at 1 A wavelength requires a detailed understanding of the photon-induced damage processes. We discuss how several aspects of existing continuum damage models can be tested during early operation of XFELs at lower x-ray energies in the range of 0.8-5 keV and low fluences, focusing particularly on macroscopic collective effects such as particle charging, expansion, and average ionization of nanospheres.

Publication types

  • Research Support, U.S. Gov't, Non-P.H.S.

MeSH terms

  • Computer Simulation
  • Electrons
  • Lasers*
  • Models, Biological*
  • Nanospheres / radiation effects*
  • Particle Size
  • Radiation*
  • X-Ray Diffraction
  • X-Rays