Advanced electron microscopy in materials physics
J Electron Microsc (Tokyo)
.
2009 Jun;58(3):73-5.
doi: 10.1093/jmicro/dfp014.
Epub 2009 Apr 30.
Authors
Yimei Zhu
,
Konrad Jarausch
PMID:
19406985
DOI:
10.1093/jmicro/dfp014
No abstract available
Publication types
Introductory Journal Article