Self-formed exchange bias of switchable conducting filaments in NiO resistive random access memory capacitors

ACS Nano. 2010 Jun 22;4(6):3288-92. doi: 10.1021/nn100323x.

Abstract

We report on the ferromagnetism of conducting filaments formed in a NiO thin film, which exhibited a typical bistable resistive switching characteristic. The NiO thin film showed an antiferromagnetic hysteresis loop for a high resistive state (R(OFF)). However, for a low resistive state (R(ON)), the conducting filaments exhibited a ferromagnetic hysteresis loop for the field cooling. The ferromagnetic hysteresis behavior of the R(ON) state reveals switchable exchange coupling between the ferromagnetic Ni conducting filaments and the antiferromagnetic NiO layer.

Publication types

  • Research Support, Non-U.S. Gov't

MeSH terms

  • Electric Capacitance
  • Electric Conductivity
  • Electric Impedance
  • Electromagnetic Fields
  • Electronics / instrumentation*
  • Equipment Design
  • Equipment Failure Analysis
  • Nanostructures / chemistry*
  • Nanotechnology / instrumentation*
  • Nickel / chemistry*
  • Particle Size

Substances

  • Nickel
  • nickel monoxide