Three-dimensional Electrical Property Mapping with Nanometer Resolution

Alexander Alekseev; Anton Efimov; Kangbo Lu; Joachim Loos

doi:10.1002/adma.200901754

Three-dimensional Electrical Property Mapping with Nanometer Resolution

Adv Mater. 2009 Dec 28;21(48):4915-4919. doi: 10.1002/adma.200901754. Epub 2009 Sep 3.

Authors

Alexander Alekseev^{1

2

3}, Anton Efimov⁴, Kangbo Lu^{1

2

5}, Joachim Loos^{1

2

5

6}

Affiliations

¹ Dutch Polymer Institute Eindhoven University of Technology 5600 AX Eindhoven (The Netherlands).
² Laboratory of Materials and Interface Chemistry Eindhoven University of Technology 5600 MB Eindhoven (The Netherlands).
³ NT-MDT Co 124460 Moscow (Russia).
⁴ Laboratory of Bionanotechnology V.I. Shumakov Federal Research Center of Transplantology and Artificial Organs Moscow (Russia).
⁵ Soft-Matter CryoTEM Research Unit Eindhoven University of Technology 5600 MB Eindhoven (The Netherlands).
⁶ Laboratory of Polymer Technology Eindhoven University of Technology 5600 MB Eindhoven (The Netherlands).

PMID: 25377493
DOI: 10.1002/adma.200901754

Abstract

The conductivity behavior of MWCNT networks within the volume of polymer nanocomposite samples is analyzed with nanometer resolution in all three dimensions. It is demonstrated that close to but above the percolation threshold for electrical conduction most of the MWCNTs do not contribute to the conductive network within the nanocomposite.

Keywords: Carbon nanotubes; Conducting materials; Conductivity; Nanocomposites.