Characterization of spatially resolved high resolution x-ray spectrometers for high energy density physics and light source experiments

K W Hill; M Bitter; L Delgado-Aparacio; P Efthimion; N A Pablant; J Lu; P Beiersdorfer; H Chen; E Magee

doi:10.1063/1.4890260

Characterization of spatially resolved high resolution x-ray spectrometers for high energy density physics and light source experiments

Rev Sci Instrum. 2014 Nov;85(11):11D612. doi: 10.1063/1.4890260.

Authors

K W Hill¹, M Bitter¹, L Delgado-Aparacio¹, P Efthimion¹, N A Pablant¹, J Lu², P Beiersdorfer³, H Chen³, E Magee³

Affiliations

¹ Princeton Plasma Physics Laboratory, Princeton, New Jersey 08543, USA.
² Key Laboratory of Optoelectronic Technology and System of Ministry of Education, Chongqing University, Chongqing 400030, China.
³ Physics Division, Lawrence Livermore National Laboratory, Livermore, California 94550, USA.

PMID: 25430188
DOI: 10.1063/1.4890260

Abstract

A high resolution 1D imaging x-ray spectrometer concept comprising a spherically bent crystal and a 2D pixelated detector is being optimized for diagnostics of small sources such as high energy density physics (HEDP) and synchrotron radiation or x-ray free electron laser experiments. This instrument is used on tokamak experiments for Doppler measurements of ion temperature and plasma flow velocity profiles. Laboratory measurements demonstrate a resolving power, E/ΔE of order 10,000 and spatial resolution better than 10 μm. Initial tests of the high resolution instrument on HEDP plasmas are being performed.