Silicon drift detector based X-ray spectroscopy diagnostic system for the study of non-thermal electrons at Aditya tokamak

S Purohit; Y S Joisa; J V Raval; J Ghosh; R Tanna; B K Shukla; S B Bhatt

doi:10.1063/1.4890406

Silicon drift detector based X-ray spectroscopy diagnostic system for the study of non-thermal electrons at Aditya tokamak

Rev Sci Instrum. 2014 Nov;85(11):11E419. doi: 10.1063/1.4890406.

Authors

S Purohit¹, Y S Joisa¹, J V Raval¹, J Ghosh¹, R Tanna¹, B K Shukla¹, S B Bhatt¹

Affiliation

¹ Institute for Plasma Research, Bhat, Gandhinagar 382 428, India.

PMID: 25430326
DOI: 10.1063/1.4890406

Abstract

Silicon drift detector based X-ray spectrometer diagnostic was developed to study the non-thermal electron for Aditya tokamak plasma. The diagnostic was mounted on a radial mid plane port at the Aditya. The objective of diagnostic includes the estimation of the non-thermal electron temperature for the ohmically heated plasma. Bi-Maxwellian plasma model was adopted for the temperature estimation. Along with that the study of high Z impurity line radiation from the ECR pre-ionization experiments was also aimed. The performance and first experimental results from the new X-ray spectrometer system are presented.