Palladium 1D nanoscale aggregates on a graphite surface using CTAB hemicylindrical micelle templates

I R Nizameev; M K Kadirov; V A Semyonov; L Ya Zakharova; T I Ismaev; R A Safiullin; I Kh Rizvanov; V M Babaev

doi:10.1039/c6dt01234e

Palladium 1D nanoscale aggregates on a graphite surface using CTAB hemicylindrical micelle templates

Dalton Trans. 2016 Jul 5;45(27):11035-41. doi: 10.1039/c6dt01234e.

Authors

I R Nizameev¹, M K Kadirov², V A Semyonov³, L Ya Zakharova⁴, T I Ismaev³, R A Safiullin³, I Kh Rizvanov⁴, V M Babaev⁴

Affiliations

¹ A.E. Arbuzov Institute of Organic and Physical Chemistry, Kazan Scientific Center, Russian Academy of Sciences, 8, Akad. Arbuzova str., Kazan 420088, Russia. [email protected] and Kazan National Research Technical University, 10, K. Marx str., Kazan 420111, Russia.
² A.E. Arbuzov Institute of Organic and Physical Chemistry, Kazan Scientific Center, Russian Academy of Sciences, 8, Akad. Arbuzova str., Kazan 420088, Russia. [email protected] and Kazan National Research Technological University, 68, K. Marx str., Kazan 420015, Russia.
³ Kazan National Research Technological University, 68, K. Marx str., Kazan 420015, Russia.
⁴ A.E. Arbuzov Institute of Organic and Physical Chemistry, Kazan Scientific Center, Russian Academy of Sciences, 8, Akad. Arbuzova str., Kazan 420088, Russia. [email protected].

PMID: 27315147
DOI: 10.1039/c6dt01234e

Abstract

Nanoscale palladium clusters in the form of parallel strips have been formed on the surface of graphite with the help of a surface micellar template of cetyltrimethylammonium bromide using a chemical deposition method. The repeat period of the palladium strips deposited at 25 °C is 65 nm, with a width of 40 nm and height of 2 nm. The elemental composition of the metal clusters was confirmed using X-ray fluorescence analysis and TEM-EDX. The fact that the strips are composed of metallic palladium was also confirmed by testing the membrane electrode assembly with the strips in a commercial fuel cell. Using the obtained micellar template, the radius of the curvature of the AFM probe tip was estimated with the help of a unique method. The radius is equal to 10 nm and matches the value provided by the manufacturer.