Talbot-Lau x-ray deflectometer electron density diagnostic for laser and pulsed power high energy density plasma experiments (invited)

M P Valdivia; D Stutman; C Stoeckl; C Mileham; I A Begishev; W Theobald; J Bromage; S P Regan; S R Klein; G Muñoz-Cordovez; M Vescovi; V Valenzuela-Villaseca; F Veloso

doi:10.1063/1.4959158

Talbot-Lau x-ray deflectometer electron density diagnostic for laser and pulsed power high energy density plasma experiments (invited)

Rev Sci Instrum. 2016 Nov;87(11):11D501. doi: 10.1063/1.4959158.

Authors

M P Valdivia¹, D Stutman¹, C Stoeckl², C Mileham², I A Begishev², W Theobald², J Bromage², S P Regan², S R Klein³, G Muñoz-Cordovez⁴, M Vescovi⁴, V Valenzuela-Villaseca⁴, F Veloso⁴

Affiliations

¹ Department of Physics and Astronomy, Johns Hopkins University, Baltimore, Maryland 21218, USA.
² Laboratory for Laser Energetics, University of Rochester, Rochester, New York 14623, USA.
³ Center for Laser Experimental Astrophysical Research, University of Michigan, Ann Arbor, Michigan 48105, USA.
⁴ Instituto de Física, Pontificia Universidad Católica de Chile, Macul, Santiago, Chile.

PMID: 27910439
DOI: 10.1063/1.4959158

Abstract

Talbot-Lau X-ray deflectometry (TXD) has been developed as an electron density diagnostic for High Energy Density (HED) plasmas. The technique can deliver x-ray refraction, attenuation, elemental composition, and scatter information from a single Moiré image. An 8 keV Talbot-Lau interferometer was deployed using laser and x-pinch backlighters. Grating survival and electron density mapping were demonstrated for 25-29 J, 8-30 ps laser pulses using copper foil targets. Moiré pattern formation and grating survival were also observed using a copper x-pinch driven at 400 kA, ∼1 kA/ns. These results demonstrate the potential of TXD as an electron density diagnostic for HED plasmas.