APT mass spectrometry and SEM data for CdTe solar cells

Jonathan D Poplawsky; Chen Li; Naba R Paudel; Wei Guo; Yanfa Yan; Stephen J Pennycook

doi:10.1016/j.dib.2016.03.042

APT mass spectrometry and SEM data for CdTe solar cells

Data Brief. 2016 Mar 16:7:779-785. doi: 10.1016/j.dib.2016.03.042. eCollection 2016 Jun.

Authors

Jonathan D Poplawsky¹, Chen Li², Naba R Paudel³, Wei Guo¹, Yanfa Yan³, Stephen J Pennycook⁴

Affiliations

¹ Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA.
² Department of Lithospheric Research, University of Vienna, Vienna, Austria.
³ The University of Toledo, Department of Physics and Astronomy, McMaster Hall, 2nd Floor Rm 2017, Toledo, OH 43606, USA.
⁴ National University of Singapore, Department of Materials Science and Engineering, Singapore.

Abstract

Atom probe tomography (APT) data acquired from a CAMECA LEAP 4000 XHR for the CdS/CdTe interface for a non-CdCl₂ treated CdTe solar cell as well as the mass spectrum of an APT data set including a GB in a CdCl₂-treated CdTe solar cell are presented. Scanning electron microscopy (SEM) data showing the evolution of sample preparation for APT and scanning transmission electron microscopy (STEM) electron beam induced current (EBIC) are also presented. These data show mass spectrometry peak decomposition of Cu and Te within an APT dataset, the CdS/CdTe interface of an untreated CdTe solar cell, preparation of APT needles from the CdS/CdTe interface in superstrate grown CdTe solar cells, and the preparation of a cross-sectional STEM EBIC sample.

Keywords: Atom probe tomography; Mass spectroscopy; Scanning electron microscopy; Solar cells.