Using Mass Resolving Power as a Performance Metric in the Atom Probe
Microsc Microanal
.
2016 Jul;22(Suppl 3):680-681.
doi: 10.1017/s1431927616004256.
Epub 2016 Jul 25.
Authors
Fred Meisenkothen
1
,
Thomas F Kelly
2
,
Edward Oltman
2
,
Joseph H Bunton
2
,
Ludovic Renaud
3
,
David J Larson
2
Affiliations
1
National Institute for Standards and Technology, Gaithersburg, MD U.S.A.
2
CAMECA Instruments, Inc., Madison, WI U.S.A.
3
CAMECA SA, Gennevilliers, France.
PMID:
33762884
PMCID:
PMC7987232
DOI:
10.1017/s1431927616004256
No abstract available
Grants and funding
9999-NIST/ImNIST/Intramural NIST DOC/United States