Author Correction: Highly accurate determination of heterogeneously stacked Van-der-Waals materials by optical microspectroscopy
Sci Rep
.
2023 Jan 25;13(1):1410.
doi: 10.1038/s41598-023-28605-0.
Authors
Andreas Hutzler
1
,
Birk Fritsch
2
,
Christian D Matthus
3
,
Michael P M Jank
4
,
Mathias Rommel
4
Affiliations
1
Electron Devices (LEB), Friedrich-Alexander University Erlangen-Nürnberg, Cauerstraße 6, 91058, Erlangen, Germany.
[email protected]
.
2
Electron Devices (LEB), Friedrich-Alexander University Erlangen-Nürnberg, Cauerstraße 6, 91058, Erlangen, Germany.
3
Circuit Design and Network Theory, Technische Universität Dresden, Helmholtzstraße 18, 01069, Dresden, Germany.
4
Fraunhofer Institute for Integrated Systems and Device Technology IISB, Schottkystraße 10, 91058, Erlangen, Germany.
PMID:
36697492
PMCID:
PMC9876962
DOI:
10.1038/s41598-023-28605-0
No abstract available
Publication types
Published Erratum