Treatment of noise caused by radiation damage during cryo-EM data collection

Rick Huang; Dan Shi

doi:10.1016/j.str.2023.11.005

Treatment of noise caused by radiation damage during cryo-EM data collection

Structure. 2023 Dec 7;31(12):1523-1525. doi: 10.1016/j.str.2023.11.005.

Authors

Rick Huang¹, Dan Shi²

Affiliations

¹ Laboratory of Cell Biology, Center for Cancer Research, National Cancer Institute, Bethesda, MD 20892, USA.
² Center for Structural Biology, Center for Cancer Research, National Cancer Institute, Frederick, MD 21702, USA. Electronic address: [email protected].

PMID: 38065075
DOI: 10.1016/j.str.2023.11.005

Abstract

Here, we discuss how noise that is caused by radiation damage during cryo-EM data collections accumulates during single-particle analysis (SPA), MicroED, and cryo-ET. For MicroED and SPA, bad data can be identified and excluded during data collection and processing, whereas cryo-ET will require systematic radiation damage assessments that can be derived from SPA.

Published by Elsevier Ltd.

MeSH terms

Cryoelectron Microscopy
Data Collection
Single Molecule Imaging*