Framework for evaluating photon-counting detectors under pile-up conditions

J Med Imaging (Bellingham). 2024 Dec;11(Suppl 1):S12802. doi: 10.1117/1.JMI.11.S1.S12802. Epub 2024 May 24.

Abstract

Purpose: While X-ray photon-counting detectors (PCDs) promise to revolutionize medical imaging, theoretical frameworks to evaluate them are commonly limited to incident fluence rates sufficiently low that the detector response can be considered linear. However, typical clinical operating conditions lead to a significant level of pile-up, invalidating this assumption of a linear response. Here, we present a framework that aims to evaluate PCDs, taking into account their non-linear behavior.

Approach: We employ small-signal analysis to study the behavior of PCDs under pile-up conditions. The response is approximated as linear around a given operating point, determined by the incident spectrum and fluence rate. The detector response is subsequently described by the proposed perturbation point spread function (pPSF). We demonstrate this approach using Monte-Carlo simulations of idealized direct- and indirect-conversion PCDs.

Results: The pPSFs of two PCDs are calculated. It is then shown how the pPSF allows to determine the sensitivity of the detector signal to an arbitrary lesion. This example illustrates the detrimental influence of pile-up, which may cause non-intuitive effects such as contrast/contrast-to-noise ratio inversion or cancellation between/within energy bins.

Conclusions: The proposed framework permits quantifying the spectral and spatial performance of PCDs under clinically realistic conditions at a given operating point. The presented example illustrates why PCDs should not be analyzed assuming that they are linear systems. The framework can, for example, be used to guide the development of PCDs and PCD-based systems. Furthermore, it can be applied to adapt commonly used measures, such as the modulation transfer function, to non-linear PCDs.

Keywords: medical imaging; non-linear systems; photon-counting X-ray detectors; pile-up; point spread function; small-signal analysis.