Measuring the sensitivity of imaging plates to keV carbon ions

Yukio Hayashi; Michiaki Mori; Hideyuki Kotaki; Shinobu Onoda; Keisuke Yamada; Masaki Kando

doi:10.1063/5.0239169

Measuring the sensitivity of imaging plates to keV carbon ions

Rev Sci Instrum. 2024 Dec 1;95(12):123309. doi: 10.1063/5.0239169.

Authors

Yukio Hayashi¹, Michiaki Mori¹, Hideyuki Kotaki¹, Shinobu Onoda², Keisuke Yamada², Masaki Kando¹

Affiliations

¹ Kansai Photon Science Institute, National Institutes for Quantum Science and Technology, 8-1-7 Umemidai, Kizugawa-shi, Kyoto 619-0215, Japan.
² Takasaki Institute for Advanced Quantum Science, National Institutes for Quantum Science and Technology, 1233 Watanuki-machi, Takasaki-shi, Gunma 370-1292, Japan.

PMID: 39724328
DOI: 10.1063/5.0239169

Abstract

Imaging plates (IPs) are valuable tools for measuring the intensity of ionizing radiation such as x-rays, electrons, and ions. In this work, we measured the sensitivity of IPs to carbon ions in the unexplored energy region of 0.7-10 keV. These carbon ions were generated using a low-energy electron cyclotron resonance ion-beam source and were subsequently transported to the IPs via an energy-selecting bending magnet. We found that the measured sensitivity exhibited a nonlinear relationship with ion energy, for which the existing formula does not account. Thus, we propose a new formula that can effectively describe the sensitivity of IPs to carbon ions with energies from the single-keV range to higher values.