New 500 kV electron microscope
J Electron Microsc (Tokyo)
.
1965;14(2):88-92.
Authors
B Tadano
,
Y Sakaki
,
S Maruse
,
K Mihama
,
Y Kamiya
,
R Uyeda
,
H Kimura
,
S Katagirl
,
M Nishigaki
PMID:
5855114
No abstract available
MeSH terms
Microscopy, Electron / instrumentation*