Epiluminescence microscopy of small pigmented skin lesions: short-term formal training improves the diagnostic performance of dermatologists

J Am Acad Dermatol. 1997 Feb;36(2 Pt 1):197-202. doi: 10.1016/s0190-9622(97)70280-9.

Abstract

Background: Epiluminescence microscopy (ELM) makes subsurface structures of the skin accessible for in vivo examination and provides additional criteria for the clinical diagnosis of pigmented skin lesions (PSLs). We demonstrated that ELM increases diagnostic sensitivity in dermatologists formally trained in the use of this technique but decreases diagnostic ability in dermatologists not formally trained in its application.

Objective: Our purpose was to determine the effects of short formal ELM training on the diagnostic performance of 11 previously untrained dermatologists.

Methods: One hundred image-pairs of randomly selected histologically proven PSLs, photographed with (ELM) and without oil immersion (surface microscopy), were presented by slide projection to the testees. To evaluate the effects on diagnostic performance before and after short-term training, we used the receiver-operator characteristics technique.

Results: Without training the use of ELM did not enhance diagnostic accuracy, but rather decreased it in 8 of 11 testees. In contrast, after 9 hours of formal training in ELM the diagnostic performance of the testees was significantly enhanced with an average gain of 8.4%.

Conclusion: Our data confirm that formal training is required for the useful application of the ELM technique.

Publication types

  • Research Support, Non-U.S. Gov't

MeSH terms

  • Austria
  • Carcinoma, Basal Cell / pathology
  • Case-Control Studies
  • Dermatology / education*
  • Diagnosis, Differential
  • Education, Medical, Continuing*
  • Humans
  • Image Enhancement / methods*
  • Luminescent Measurements
  • Melanoma / pathology
  • Microscopy / methods*
  • ROC Curve
  • Random Allocation
  • Sensitivity and Specificity
  • Skin Diseases / pathology*
  • Skin Neoplasms / pathology*