Experimental proof of the electronic charge-transfer mechanism in a YBa2Cu3O7-x-based field-effect transistor
Phys Rev B Condens Matter
.
1996 Jun 1;53(21):14575-14580.
doi: 10.1103/physrevb.53.14575.
Authors
V Talyansky V
,
SB Ogale
,
I Takeuchi I
,
C Doughty
,
T Venkatesan
PMID:
9983257
DOI:
10.1103/physrevb.53.14575
No abstract available