Modeling of the sputtering process of cubic silver halide microcrystals and its relevance in depth profiling by secondary-ion mass spectrometry (SIMS).
Fresenius J Anal Chem. 2001 Jul;370(5):654-62. doi: 10.1007/s002160100880.
Fresenius J Anal Chem. 2001.
PMID: 11497001