Matsui Y - Search Results

1

The study of Al-L23 ELNES with resolution-enhancement software and first-principles calculation.

Kimoto K, Ishizuka K, Mizoguchi T, Tanaka I, Matsui Y. Kimoto K, et al. Among authors: matsui y. J Electron Microsc (Tokyo). 2003;52(3):299-303. doi: 10.1093/jmicro/52.3.299. J Electron Microsc (Tokyo). 2003. PMID: 12892219

2

Local crystal structure analysis with 10-pm accuracy using scanning transmission electron microscopy.

Saito M, Kimoto K, Nagai T, Fukushima S, Akahoshi D, Kuwahara H, Matsui Y, Ishizuka K. Saito M, et al. Among authors: matsui y. J Electron Microsc (Tokyo). 2009 Jun;58(3):131-6. doi: 10.1093/jmicro/dfn023. Epub 2008 Nov 25. J Electron Microsc (Tokyo). 2009. PMID: 19033323

3

Fourier images feature of lattice fringes formed by low-loss electrons as observed using spatially-resolved EELS technique.

Kimoto K, Matsui Y. Kimoto K, et al. Among authors: matsui y. J Electron Microsc (Tokyo). 2001;50(5):377-82. doi: 10.1093/jmicro/50.5.377. J Electron Microsc (Tokyo). 2001. PMID: 11794612

4

Software techniques for EELS to realize about 0.3 eV energy resolution using 300 kV FEG-TEM.

Kimoto K, Matsui Y. Kimoto K, et al. Among authors: matsui y. J Microsc. 2002 Dec;208(Pt 3):224-8. doi: 10.1046/j.1365-2818.2002.01083.x. J Microsc. 2002. PMID: 12460453

5

Experimental investigation of phase contrast formed by inelastically scattered electrons.

Kimoto K, Matsui Y. Kimoto K, et al. Among authors: matsui y. Ultramicroscopy. 2003 Sep;96(3-4):335-42. doi: 10.1016/S0304-3991(03)00099-8. Ultramicroscopy. 2003. PMID: 12871799

6

TEM study of the influence of antisite defects on magnetic domain structures in double perovskite Ba2FeMoO6.

Yu X, Asaka T, Tomioka Y, Tsuruta C, Nagai T, Kimoto K, Kaneko Y, Tokura Y, Matsui Y. Yu X, et al. Among authors: matsui y. J Electron Microsc (Tokyo). 2005 Jan;54(1):61-5. doi: 10.1093/jmicro/dfh104. J Electron Microsc (Tokyo). 2005. PMID: 15695487

7

0.23 eV energy resolution obtained using a cold field-emission gun and a streak imaging technique.

Kimoto K, Ishizuka K, Asaka T, Nagai T, Matsui Y. Kimoto K, et al. Among authors: matsui y. Micron. 2005;36(5):465-9. doi: 10.1016/j.micron.2005.03.008. Epub 2005 Apr 25. Micron. 2005. PMID: 15896969

8

Development of dedicated STEM with high stability.

Kimoto K, Nakamura K, Aizawa S, Isakozawa S, Matsui Y. Kimoto K, et al. Among authors: matsui y. J Electron Microsc (Tokyo). 2007 Jan;56(1):17-20. doi: 10.1093/jmicro/dfl043. Epub 2007 Feb 2. J Electron Microsc (Tokyo). 2007. PMID: 17277005

9

Element-selective imaging of atomic columns in a crystal using STEM and EELS.

Kimoto K, Asaka T, Nagai T, Saito M, Matsui Y, Ishizuka K. Kimoto K, et al. Among authors: matsui y. Nature. 2007 Nov 29;450(7170):702-4. doi: 10.1038/nature06352. Epub 2007 Oct 28. Nature. 2007. PMID: 17965728

10

Decisive factors for realizing atomic-column resolution using STEM and EELS.

Kimoto K, Ishizuka K, Matsui Y. Kimoto K, et al. Among authors: matsui y. Micron. 2008;39(3):257-62. doi: 10.1016/j.micron.2007.09.009. Epub 2007 Oct 2. Micron. 2008. PMID: 18054240

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