Vangaever F - Search Results

1

Comparative study of organic dyes with time-of-flight static secondary ion mass spectrometry and related techniques.

Adriaensen L, Vangaever F, Lenaerts J, Gijbels R. Adriaensen L, et al. Among authors: vangaever f. J Mass Spectrom. 2005 May;40(5):615-27. doi: 10.1002/jms.832. J Mass Spectrom. 2005. PMID: 15712231

2

Metal-assisted secondary ion mass spectrometry: influence of Ag and Au deposition on molecular ion yields.

Adriaensen L, Vangaever F, Gijbels R. Adriaensen L, et al. Among authors: vangaever f. Anal Chem. 2004 Nov 15;76(22):6777-85. doi: 10.1021/ac049108d. Anal Chem. 2004. PMID: 15538803

3

Ion yield improvement for static secondary ion mass spectrometry by use of polyatomic primary ions.

De Mondt R, Van Vaeck L, Heile A, Arlinghaus HF, Nieuwjaer N, Delcorte A, Bertrand P, Lenaerts J, Vangaever F. De Mondt R, et al. Among authors: vangaever f. Rapid Commun Mass Spectrom. 2008 May;22(10):1481-96. doi: 10.1002/rcm.3533. Rapid Commun Mass Spectrom. 2008. PMID: 18401858

4

TOF-S-SIMS molecular depth profiling of organic bilayers using mechanical wear test methodology.

De Mondt R, Van Vaeck L, Heile A, Arlinghaus HF, Vangaever F, Lenaerts J. De Mondt R, et al. Among authors: vangaever f. Anal Bioanal Chem. 2009 Apr;393(8):1917-21. doi: 10.1007/s00216-009-2657-4. Epub 2009 Feb 26. Anal Bioanal Chem. 2009. PMID: 19241066

5

Ultra-low-angle microtomy and static secondary ion mass spectrometry for molecular depth profiling of UV-curable acrylate multilayers at the nanoscale.

Vercammen Y, De Mondt R, Van Luppen J, Vangaever F, Van Vaeck L. Vercammen Y, et al. Among authors: vangaever f. Anal Bioanal Chem. 2010 Apr;396(8):2943-54. doi: 10.1007/s00216-010-3507-0. Epub 2010 Mar 6. Anal Bioanal Chem. 2010. PMID: 20213176

6

Laser microprobe with fourier transform ion cyclotron resonance mass spectrometer for surface analysis.

Moisio H, Vaeck LV, Vangaever F. Moisio H, et al. Among authors: vangaever f. Anal Chem. 2007 Jan 1;79(1):280-90. doi: 10.1021/ac0612776. Anal Chem. 2007. PMID: 17194152

7

ToF-S-SIMS molecular 3D analysis of micro-objects as an alternative to ion beam erosion at large depth: application to single inkjet dots.

Vercammen Y, Van Luppen J, Van Roost C, De Mondt R, Vangaever F, Van Vaeck L. Vercammen Y, et al. Among authors: vangaever f. Anal Bioanal Chem. 2013 Feb;405(6):2053-64. doi: 10.1007/s00216-012-6647-6. Epub 2013 Jan 16. Anal Bioanal Chem. 2013. PMID: 23322348

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