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Scaling limits of resistive memories.
Zhirnov VV, Meade R, Cavin RK, Sandhu G. Zhirnov VV, et al. Among authors: cavin rk. Nanotechnology. 2011 Jun 24;22(25):254027. doi: 10.1088/0957-4484/22/25/254027. Epub 2011 May 16. Nanotechnology. 2011. PMID: 21572197
Nanodevices: charge of the heavy brigade.
Zhirnov VV, Cavin RK. Zhirnov VV, et al. Among authors: cavin rk. Nat Nanotechnol. 2008 Jul;3(7):377-8. doi: 10.1038/nnano.2008.197. Nat Nanotechnol. 2008. PMID: 18654555 No abstract available.
Nanoelectronics: negative capacitance to the rescue?
Zhirnov VV, Cavin RK. Zhirnov VV, et al. Among authors: cavin rk. Nat Nanotechnol. 2008 Feb;3(2):77-8. doi: 10.1038/nnano.2008.18. Nat Nanotechnol. 2008. PMID: 18654465 No abstract available.
44 results