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High-resolution ab initio three-dimensional x-ray diffraction microscopy.
Chapman HN, Barty A, Marchesini S, Noy A, Hau-Riege SP, Cui C, Howells MR, Rosen R, He H, Spence JC, Weierstall U, Beetz T, Jacobsen C, Shapiro D. Chapman HN, et al. Among authors: cui c. J Opt Soc Am A Opt Image Sci Vis. 2006 May;23(5):1179-200. doi: 10.1364/josaa.23.001179. J Opt Soc Am A Opt Image Sci Vis. 2006. PMID: 16642197
Three-dimensional coherent x-ray diffraction imaging of a ceramic nanofoam: determination of structural deformation mechanisms.
Barty A, Marchesini S, Chapman HN, Cui C, Howells MR, Shapiro DA, Minor AM, Spence JC, Weierstall U, Ilavsky J, Noy A, Hau-Riege SP, Artyukhin AB, Baumann T, Willey T, Stolken J, van Buuren T, Kinney JH. Barty A, et al. Among authors: cui c. Phys Rev Lett. 2008 Aug 1;101(5):055501. doi: 10.1103/PhysRevLett.101.055501. Epub 2008 Jul 28. Phys Rev Lett. 2008. PMID: 18764404
An assessment of the resolution limitation due to radiation-damage in x-ray diffraction microscopy.
Howells MR, Beetz T, Chapman HN, Cui C, Holton JM, Jacobsen CJ, Kirz J, Lima E, Marchesini S, Miao H, Sayre D, Shapiro DA, Spence JC, Starodub D. Howells MR, et al. Among authors: cui c. J Electron Spectros Relat Phenomena. 2009 Mar 1;170(1-3):4-12. doi: 10.1016/j.elspec.2008.10.008. J Electron Spectros Relat Phenomena. 2009. PMID: 20463854 Free PMC article.
4,285 results