Suzer S - Search Results

1

XPS characterization of Au (Core)/SiO2 (shell) nanoparticles.

Tunc I, Suzer S, Correa-Duarte MA, Liz-Marzán LM. Tunc I, et al. Among authors: suzer s. J Phys Chem B. 2005 Apr 28;109(16):7597-600. doi: 10.1021/jp050767j. J Phys Chem B. 2005. PMID: 16851877

2

Charging/discharging of Au (core)/silica (shell) nanoparticles as revealed by XPS.

Tunc I, Demirok UK, Suzer S, Correa-Duatre MA, Liz-Marzan LM. Tunc I, et al. Among authors: suzer s. J Phys Chem B. 2005 Dec 22;109(50):24182-4. doi: 10.1021/jp055614a. J Phys Chem B. 2005. PMID: 16375410

3

Optical response of Ag-Au bimetallic nanoparticles to electron storage in aqueous medium.

Tunc I, Guvenc HO, Sezen H, Suzer S, Correa-Duarte MA, Liz-Marzán LM. Tunc I, et al. Among authors: suzer s. J Nanosci Nanotechnol. 2008 Jun;8(6):3003-7. doi: 10.1166/jnn.2008.157. J Nanosci Nanotechnol. 2008. PMID: 18681038

4

X-ray photoelectron spectroscopic analysis of Si nanoclusters in SiO2 matrix.

Dane A, Demirok UK, Aydinli A, Suzer S. Dane A, et al. Among authors: suzer s. J Phys Chem B. 2006 Jan 26;110(3):1137-40. doi: 10.1021/jp0545748. J Phys Chem B. 2006. PMID: 16471655

5

Differential charging in X-ray photoelectron spectroscopy: a nuisance or a useful tool?

Suzer S. Suzer S. Anal Chem. 2003 Dec 15;75(24):7026-9. doi: 10.1021/ac034823t. Anal Chem. 2003. PMID: 14670067

6

X-ray photoemission for probing charging/discharging dynamics.

Suzer S, Dâna A. Suzer S, et al. J Phys Chem B. 2006 Oct 5;110(39):19112-5. doi: 10.1021/jp0644006. J Phys Chem B. 2006. PMID: 17004757

7

Effect of solvent refractive index on the surface plasmon resonance nanoparticle optical absorption.

Ertas G, Suzer S. Ertas G, et al. Among authors: suzer s. J Nanosci Nanotechnol. 2007 Dec;7(12):4333-8. doi: 10.1166/jnn.2007.906. J Nanosci Nanotechnol. 2007. PMID: 18283811

8

Two-dimensional X-ray photoelectron spectroscopy for composite surface analysis.

Suzer S, Sezen H, Dâna A. Suzer S, et al. Anal Chem. 2008 May 15;80(10):3931-6. doi: 10.1021/ac702642w. Epub 2008 Apr 16. Anal Chem. 2008. PMID: 18412370

9

Response of polyelectrolyte layers to the SiO2 substrate charging as probed by XPS.

Conger CP, Suzer S. Conger CP, et al. Among authors: suzer s. Langmuir. 2009 Feb 3;25(3):1757-60. doi: 10.1021/la803305w. Langmuir. 2009. PMID: 19125603

10

Communication: enhancement of dopant dependent x-ray photoelectron spectroscopy peak shifts of Si by surface photovoltage.

Sezen H, Suzer S. Sezen H, et al. Among authors: suzer s. J Chem Phys. 2011 Oct 14;135(14):141102. doi: 10.1063/1.3652964. J Chem Phys. 2011. PMID: 22010685

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