Search Page
Save citations to file
Email citations
Send citations to clipboard
Add to Collections
Add to My Bibliography
Create a file for external citation management software
Your saved search
Your RSS Feed
Search Results
3 results
Filters applied: . Clear all
Results are displayed in a computed author sort order.
The Publication Date timeline is not available.
Page 1
New Cs sputter ion source with polyatomic ion beams for secondary ion mass spectrometry applications.
Rev Sci Instrum. 2007 Aug;78(8):085101. doi: 10.1063/1.2761021.
Rev Sci Instrum. 2007.
PMID: 17764349
Free article.
Sputtering of silicon nanopowders by an argon cluster ion beam.
Zeng X, Pelenovich V, Wang Z, Zuo W, Belykh S, Tolstogouzov A, Fu D, Xiao X.
Zeng X, et al.
Beilstein J Nanotechnol. 2019 Jan 10;10:135-143. doi: 10.3762/bjnano.10.13. eCollection 2019.
Beilstein J Nanotechnol. 2019.
PMID: 30680286
Free PMC article.
Item in Clipboard
Cluster secondary ion emission of silicon: An influence of the samples' dimensional features.
Tolstogouzov A, Drozdov MN, Belykh SF, Gololobov GP, Ieshkin AE, Mazarov P, Suvorov DV, Fu D, Pelenovich V, Zeng X, Zuo W.
Tolstogouzov A, et al. Among authors: belykh sf.
Rapid Commun Mass Spectrom. 2019 Feb 15;33(3):323-325. doi: 10.1002/rcm.8345.
Rapid Commun Mass Spectrom. 2019.
PMID: 30408251
No abstract available.
Item in Clipboard
Cite
Cite
ARTICLE TYPE
ARTICLE LANGUAGE
AGE
Filters on the sidebar will be reset to the default list and any currently applied filters will be cleared.