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Page 1
Mechanism of single-shot damage of Ru thin films irradiated by femtosecond extreme UV free-electron laser.
Milov I, Makhotkin IA, Sobierajski R, Medvedev N, Lipp V, Chalupský J, Sturm JM, Tiedtke K, de Vries G, Störmer M, Siewert F, van de Kruijs R, Louis E, Jacyna I, Jurek M, Juha L, Hájková V, Vozda V, Burian T, Saksl K, Faatz B, Keitel B, Plönjes E, Schreiber S, Toleikis S, Loch R, Hermann M, Strobel S, Nienhuys HK, Gwalt G, Mey T, Enkisch H, Bijkerk F. Milov I, et al. Among authors: nienhuys hk. Opt Express. 2018 Jul 23;26(15):19665-19685. doi: 10.1364/OE.26.019665. Opt Express. 2018. PMID: 30114137 Free article.
Experimental study of EUV mirror radiation damage resistance under long-term free-electron laser exposures below the single-shot damage threshold.
Makhotkin IA, Sobierajski R, Chalupský J, Tiedtke K, de Vries G, Störmer M, Scholze F, Siewert F, van de Kruijs RWE, Milov I, Louis E, Jacyna I, Jurek M, Klinger D, Nittler L, Syryanyy Y, Juha L, Hájková V, Vozda V, Burian T, Saksl K, Faatz B, Keitel B, Plönjes E, Schreiber S, Toleikis S, Loch R, Hermann M, Strobel S, Nienhuys HK, Gwalt G, Mey T, Enkisch H. Makhotkin IA, et al. Among authors: nienhuys hk. J Synchrotron Radiat. 2018 Jan 1;25(Pt 1):77-84. doi: 10.1107/S1600577517017362. Epub 2018 Jan 1. J Synchrotron Radiat. 2018. PMID: 29271755 Free PMC article.
Delocalization of protons in liquid water.
Bakker HJ, Nienhuys HK. Bakker HJ, et al. Among authors: nienhuys hk. Science. 2002 Jul 26;297(5581):587-90. doi: 10.1126/science.1073298. Science. 2002. PMID: 12142533
11 results