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Characteristics of focused soft X-ray free-electron laser beam determined by ablation of organic molecular solids.
Chalupský J, Juha L, Kuba J, Cihelka J, Hájková V, Koptyaev S, Krása J, Velyhan A, Bergh M, Caleman C, Hajdu J, Bionta RM, Chapman H, Hau-Riege SP, London RA, Jurek M, Krzywinski J, Nietubyc R, Pelka JB, Sobierajski R, Meyer-Ter-Vehn J, Tronnier A, Sokolowski-Tinten K, Stojanovic N, Tiedtke K, Toleikis S, Tschentscher T, Wabnitz H, Zastrau U. Chalupský J, et al. Opt Express. 2007 May 14;15(10):6036-43. doi: 10.1364/oe.15.006036. Opt Express. 2007. PMID: 19546907 Free article.
Non-thermal desorption/ablation of molecular solids induced by ultra-short soft x-ray pulses.
Chalupský J, Juha L, Hájková V, Cihelka J, Vysín L, Gautier J, Hajdu J, Hau-Riege SP, Jurek M, Krzywinski J, London RA, Papalazarou E, Pelka JB, Rey G, Sebban S, Sobierajski R, Stojanovic N, Tiedtke K, Toleikis S, Tschentscher T, Valentin C, Wabnitz H, Zeitoun P. Chalupský J, et al. Opt Express. 2009 Jan 5;17(1):208-17. doi: 10.1364/oe.17.000208. Opt Express. 2009. PMID: 19129890 Free article.
Single shot damage mechanism of Mo/Si multilayer optics under intense pulsed XUV-exposure.
Khorsand AR, Sobierajski R, Louis E, Bruijn S, van Hattum ED, van de Kruijs RW, Jurek M, Klinger D, Pelka JB, Juha L, Burian T, Chalupsky J, Cihelka J, Hajkova V, Vysin L, Jastrow U, Stojanovic N, Toleikis S, Wabnitz H, Tiedtke K, Sokolowski-Tinten K, Shymanovich U, Krzywinski J, Hau-Riege S, London R, Gleeson A, Gullikson EM, Bijkerk F. Khorsand AR, et al. Opt Express. 2010 Jan 18;18(2):700-12. doi: 10.1364/OE.18.000700. Opt Express. 2010. PMID: 20173890 Free article.
Damage mechanisms of MoN/SiN multilayer optics for next-generation pulsed XUV light sources.
Sobierajski R, Bruijn S, Khorsand AR, Louis E, van de Kruijs RW, Burian T, Chalupsky J, Cihelka J, Gleeson A, Grzonka J, Gullikson EM, Hajkova V, Hau-Riege S, Juha L, Jurek M, Klinger D, Krzywinski J, London R, Pelka JB, Płociński T, Rasiński M, Tiedtke K, Toleikis S, Vysin L, Wabnitz H, Bijkerk F. Sobierajski R, et al. Opt Express. 2011 Jan 3;19(1):193-205. doi: 10.1364/OE.19.000193. Opt Express. 2011. PMID: 21263557 Free article.
Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter.
Hau-Riege SP, Chapman HN, Krzywinski J, Sobierajski R, Bajt S, London RA, Bergh M, Caleman C, Nietubyc R, Juha L, Kuba J, Spiller E, Baker S, Bionta R, Sokolowski Tinten K, Stojanovic N, Kjornrattanawanich B, Gullikson E, Plönjes E, Toleikis S, Tschentscher T. Hau-Riege SP, et al. Phys Rev Lett. 2007 Apr 6;98(14):145502. doi: 10.1103/PhysRevLett.98.145502. Epub 2007 Apr 4. Phys Rev Lett. 2007. PMID: 17501285
Soft-x-ray free-electron-laser interaction with materials.
Hau-Riege SP, London RA, Chapman HN, Bergh M. Hau-Riege SP, et al. Phys Rev E Stat Nonlin Soft Matter Phys. 2007 Oct;76(4 Pt 2):046403. doi: 10.1103/PhysRevE.76.046403. Epub 2007 Oct 17. Phys Rev E Stat Nonlin Soft Matter Phys. 2007. PMID: 17995118
Coherent X-ray diffractive imaging: applications and limitations.
Marchesini S, Chapman H, Hau-Riege S, London R, Szoke A, He H, Howells M, Padmore H, Rosen R, Spence J, Weierstall U. Marchesini S, et al. Opt Express. 2003 Sep 22;11(19):2344-53. doi: 10.1364/oe.11.002344. Opt Express. 2003. PMID: 19471343 Free article.
69 results