Double aberration correction in a low-energy electron microscope.
Schmidt T, Marchetto H, Lévesque PL, Groh U, Maier F, Preikszas D, Hartel P, Spehr R, Lilienkamp G, Engel W, Fink R, Bauer E, Rose H, Umbach E, Freund HJ.
Schmidt T, et al. Among authors: bauer e.
Ultramicroscopy. 2010 Oct;110(11):1358-61. doi: 10.1016/j.ultramic.2010.07.007. Epub 2010 Jul 13.
Ultramicroscopy. 2010.
PMID: 20692099