No time to lose--high throughput screening to assess nanomaterial safety.
Damoiseaux R, George S, Li M, Pokhrel S, Ji Z, France B, Xia T, Suarez E, Rallo R, Mädler L, Cohen Y, Hoek EM, Nel A.
Damoiseaux R, et al. Among authors: george s.
Nanoscale. 2011 Apr;3(4):1345-60. doi: 10.1039/c0nr00618a. Epub 2011 Feb 7.
Nanoscale. 2011.
PMID: 21301704
Free PMC article.
Review.