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Page 1
Local estimation of lattice constants in HRTEM images.
Niermann T, Park JB, Lehmann M. Niermann T, et al. Ultramicroscopy. 2011 Jul;111(8):1083-92. doi: 10.1016/j.ultramic.2011.03.014. Epub 2011 Mar 31. Ultramicroscopy. 2011. PMID: 21740872
Creating arrays of electron vortices.
Niermann T, Verbeeck J, Lehmann M. Niermann T, et al. Ultramicroscopy. 2014 Jan;136:165-70. doi: 10.1016/j.ultramic.2013.10.002. Epub 2013 Oct 15. Ultramicroscopy. 2014. PMID: 24184391
Noise estimation for off-axis electron holography.
Röder F, Lubk A, Wolf D, Niermann T. Röder F, et al. Among authors: niermann t. Ultramicroscopy. 2014 Sep;144:32-42. doi: 10.1016/j.ultramic.2014.04.002. Epub 2014 Apr 26. Ultramicroscopy. 2014. PMID: 24821224
Advanced double-biprism holography with atomic resolution.
Genz F, Niermann T, Buijsse B, Freitag B, Lehmann M. Genz F, et al. Among authors: niermann t. Ultramicroscopy. 2014 Dec;147:33-43. doi: 10.1016/j.ultramic.2014.06.002. Epub 2014 Jun 23. Ultramicroscopy. 2014. PMID: 24997449
Photodetection in Hybrid Single-Layer Graphene/Fully Coherent Germanium Island Nanostructures Selectively Grown on Silicon Nanotip Patterns.
Niu G, Capellini G, Lupina G, Niermann T, Salvalaglio M, Marzegalli A, Schubert MA, Zaumseil P, Krause HM, Skibitzki O, Lehmann M, Montalenti F, Xie YH, Schroeder T. Niu G, et al. Among authors: niermann t. ACS Appl Mater Interfaces. 2016 Jan 27;8(3):2017-26. doi: 10.1021/acsami.5b10336. Epub 2016 Jan 13. ACS Appl Mater Interfaces. 2016. PMID: 26709534 Free article.
Selective Epitaxy of InP on Si and Rectification in Graphene/InP/Si Hybrid Structure.
Niu G, Capellini G, Hatami F, Di Bartolomeo A, Niermann T, Hussein EH, Schubert MA, Krause HM, Zaumseil P, Skibitzki O, Lupina G, Masselink WT, Lehmann M, Xie YH, Schroeder T. Niu G, et al. Among authors: niermann t. ACS Appl Mater Interfaces. 2016 Oct 12;8(40):26948-26955. doi: 10.1021/acsami.6b09592. Epub 2016 Sep 28. ACS Appl Mater Interfaces. 2016. PMID: 27642767
34 results