Higashida K - Search Results

1

High-angle triple-axis specimen holder for three-dimensional diffraction contrast imaging in transmission electron microscopy.

Hata S, Miyazaki H, Miyazaki S, Mitsuhara M, Tanaka M, Kaneko K, Higashida K, Ikeda K, Nakashima H, Matsumura S, Barnard JS, Sharp JH, Midgley PA. Hata S, et al. Among authors: higashida k. Ultramicroscopy. 2011 Jul;111(8):1168-75. doi: 10.1016/j.ultramic.2011.03.021. Epub 2011 Apr 9. Ultramicroscopy. 2011. PMID: 21741918

2

A combined environmental straining specimen holder for high-voltage electron microscopy.

Takahashi Y, Tanaka M, Higashida K, Yasuda K, Matsumura S, Noguchi H. Takahashi Y, et al. Among authors: higashida k. Ultramicroscopy. 2010 Oct;110(11):1420-7. doi: 10.1016/j.ultramic.2010.07.011. Epub 2010 Aug 4. Ultramicroscopy. 2010. PMID: 20696527

3

Transmission electron microscopy of bulk specimens over 10µm in thickness.

Sadamatsu S, Tanaka M, Higashida K, Matsumura S. Sadamatsu S, et al. Among authors: higashida k. Ultramicroscopy. 2016 Mar;162:10-16. doi: 10.1016/j.ultramic.2015.09.001. Epub 2015 Dec 2. Ultramicroscopy. 2016. PMID: 26716725 Free article.

4

HVEM characterization of crack tip dislocations in silicon crystals.

Tanaka M, Higashida K. Tanaka M, et al. Among authors: higashida k. J Electron Microsc (Tokyo). 2004;53(4):353-60. doi: 10.1093/jmicro/dfh051. J Electron Microsc (Tokyo). 2004. PMID: 15582934

5

Crack tip shielding observed with high-resolution transmission electron microscopy.

Adhika DR, Tanaka M, Daio T, Higashida K. Adhika DR, et al. Among authors: higashida k. Microscopy (Oxf). 2015 Oct;64(5):335-40. doi: 10.1093/jmicro/dfv032. Epub 2015 Jun 26. Microscopy (Oxf). 2015. PMID: 26115957 Free PMC article.

6

3-D structures of crack-tip dislocations and their shielding effect revealed by electron tomography.

Tanaka M, Honda M, Sadamatsu S, Higashida K. Tanaka M, et al. Among authors: higashida k. J Electron Microsc (Tokyo). 2010 Aug;59 Suppl 1:S55-60. doi: 10.1093/jmicro/dfq031. Epub 2010 Jun 15. J Electron Microsc (Tokyo). 2010. PMID: 20551448

7

HVEM study of crack-tip dislocations in Si crystals prepared by FIB and twin-blade cutting method.

Tanaka M, Higashida K, Fukui T, Yokote T. Tanaka M, et al. Among authors: higashida k. J Electron Microsc (Tokyo). 2004;53(5):505-9. doi: 10.1093/jmicro/dfh052. J Electron Microsc (Tokyo). 2004. PMID: 15582956

8

Electrochemical Degradation of Pt-Ni Nanocatalysts: An Identical Location Aberration-Corrected Scanning Transmission Electron Microscopy Study.

Rasouli S, Myers D, Kariuki N, Higashida K, Nakashima N, Ferreira P. Rasouli S, et al. Among authors: higashida k. Nano Lett. 2019 Jan 9;19(1):46-53. doi: 10.1021/acs.nanolett.8b03022. Epub 2018 Dec 19. Nano Lett. 2019. PMID: 30521351

9

Site-Selective C(sp³)-H and Switchable C(sp³)-H/C(sp²)-H Functionalization Enabled by Electron-Deficient Cp*^CF3Ir(III) Catalyst and Photosensitizer.

Hirata Y, Kimura S, Higashida K, Yoshino T, Matsunaga S. Hirata Y, et al. Among authors: higashida k. Angew Chem Int Ed Engl. 2024 Dec 16:e202421026. doi: 10.1002/anie.202421026. Online ahead of print. Angew Chem Int Ed Engl. 2024. PMID: 39681515

10

Case report: The histopathological analyses of two myelin oligodendrocyte glycoprotein antibody-associated diseases with a distinctive linear radiating gadolinium enhancement on MRI.

Shimizu M, Beck G, Murayama S, Hoshi T, Sumikura H, Higashida K, Fukasaka I, Shimada Y, Nagashima N, Fujioka T, Hatayama N, Okuno T, Mochizuki H, Sakaguchi M. Shimizu M, et al. Among authors: higashida k. Front Immunol. 2024 Aug 29;15:1426236. doi: 10.3389/fimmu.2024.1426236. eCollection 2024. Front Immunol. 2024. PMID: 39267735 Free PMC article.

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