Togashi T - Search Results

1

A photodiode amplifier system for pulse-by-pulse intensity measurement of an x-ray free electron laser.

Kudo T, Tono K, Yabashi M, Togashi T, Sato T, Inubushi Y, Omodani M, Kirihara Y, Matsushita T, Kobayashi K, Yamaga M, Uchiyama S, Hatsui T. Kudo T, et al. Among authors: togashi t. Rev Sci Instrum. 2012 Apr;83(4):043108. doi: 10.1063/1.3701713. Rev Sci Instrum. 2012. PMID: 22559516

2

Response-time improved hydrothermal-method-grown ZnO scintillator for soft x-ray free-electron laser timing-observation.

Shimizu T, Yamamoi K, Estacio E, Nakazato T, Sakai K, Sarukura N, Ehrentraut D, Fukuda T, Nagasono M, Togashi T, Higashiya A, Yabashi M, Ishikawa T, Ohashi H, Kimura H. Shimizu T, et al. Among authors: togashi t. Rev Sci Instrum. 2010 Mar;81(3):033102. doi: 10.1063/1.3310276. Rev Sci Instrum. 2010. PMID: 20370156

3

Note: Measurement of saturable absorption by intense vacuum ultraviolet free electron laser using fluorescent material.

Inubushi Y, Yoneda H, Higashiya A, Ishikawa T, Kimura H, Kumagai T, Morimoto S, Nagasono M, Ohashi H, Sato F, Tanaka T, Togashi T, Tono K, Yabashi M, Yamaguchi Y, Kodama R. Inubushi Y, et al. Among authors: togashi t. Rev Sci Instrum. 2010 Mar;81(3):036101. doi: 10.1063/1.3302542. Rev Sci Instrum. 2010. PMID: 20370224

4

Multiphoton double ionization of Ar in intense extreme ultraviolet laser fields studied by shot-by-shot photoelectron spectroscopy.

Hikosaka Y, Fushitani M, Matsuda A, Tseng CM, Hishikawa A, Shigemasa E, Nagasono M, Tono K, Togashi T, Ohashi H, Kimura H, Senba Y, Yabashi M, Ishikawa T. Hikosaka Y, et al. Among authors: togashi t. Phys Rev Lett. 2010 Sep 24;105(13):133001. doi: 10.1103/PhysRevLett.105.133001. Epub 2010 Sep 21. Phys Rev Lett. 2010. PMID: 21230767

5

Extreme ultraviolet free electron laser seeded with high-order harmonic of Ti:sapphire laser.

Togashi T, Takahashi EJ, Midorikawa K, Aoyama M, Yamakawa K, Sato T, Iwasaki A, Owada S, Okino T, Yamanouchi K, Kannari F, Yagishita A, Nakano H, Couprie ME, Fukami K, Hatsui T, Hara T, Kameshima T, Kitamura H, Kumagai N, Matsubara S, Nagasono M, Ohashi H, Ohshima T, Otake Y, Shintake T, Tamasaku K, Tanaka H, Tanaka T, Togawa K, Tomizawa H, Watanabe T, Yabashi M, Ishikawa T. Togashi T, et al. Opt Express. 2011 Jan 3;19(1):317-24. doi: 10.1364/OE.19.000317. Opt Express. 2011. PMID: 21263571 Free article.

6

Observation of free-electron-laser-induced collective spontaneous emission (superfluorescence).

Nagasono M, Harries JR, Iwayama H, Togashi T, Tono K, Yabashi M, Senba Y, Ohashi H, Ishikawa T, Shigemasa E. Nagasono M, et al. Among authors: togashi t. Phys Rev Lett. 2011 Nov 4;107(19):193603. doi: 10.1103/PhysRevLett.107.193603. Epub 2011 Nov 1. Phys Rev Lett. 2011. PMID: 22181606

7

Enhanced nonlinear double excitation of He in intense extreme ultraviolet laser fields.

Hishikawa A, Fushitani M, Hikosaka Y, Matsuda A, Liu CN, Morishita T, Shigemasa E, Nagasono M, Tono K, Togashi T, Ohashi H, Kimura H, Senba Y, Yabashi M, Ishikawa T. Hishikawa A, et al. Among authors: togashi t. Phys Rev Lett. 2011 Dec 9;107(24):243003. doi: 10.1103/PhysRevLett.107.243003. Epub 2011 Dec 6. Phys Rev Lett. 2011. PMID: 22242995

8

Optical features of a LiF crystal soft X-ray imaging detector irradiated by free electron laser pulses.

Pikuz T, Faenov A, Fukuda Y, Kando M, Bolton P, Mitrofanov A, Vinogradov A, Nagasono M, Ohashi H, Yabashi M, Tono K, Senba Y, Togashi T, Ishikawa T. Pikuz T, et al. Among authors: togashi t. Opt Express. 2012 Feb 13;20(4):3424-33. doi: 10.1364/OE.20.003424. Opt Express. 2012. PMID: 22418101 Free article.

9

Determination of the pulse duration of an x-ray free electron laser using highly resolved single-shot spectra.

Inubushi Y, Tono K, Togashi T, Sato T, Hatsui T, Kameshima T, Togawa K, Hara T, Tanaka T, Tanaka H, Ishikawa T, Yabashi M. Inubushi Y, et al. Among authors: togashi t. Phys Rev Lett. 2012 Oct 5;109(14):144801. doi: 10.1103/PhysRevLett.109.144801. Epub 2012 Oct 1. Phys Rev Lett. 2012. PMID: 23083249

10

Soft x-ray free-electron laser imaging by LiF crystal and film detectors over a wide range of fluences.

Pikuz TA, Faenov AY, Fukuda Y, Kando M, Bolton P, Mitrofanov A, Vinogradov AV, Nagasono M, Ohashi H, Yabashi M, Tono K, Senba Y, Togashi T, Ishikawa T. Pikuz TA, et al. Among authors: togashi t. Appl Opt. 2013 Jan 20;52(3):509-15. doi: 10.1364/AO.52.000509. Appl Opt. 2013. PMID: 23338201

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