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Realistic metal-graphene contact structures.
Gong C, McDonnell S, Qin X, Azcatl A, Dong H, Chabal YJ, Cho K, Wallace RM. Gong C, et al. Among authors: dong h. ACS Nano. 2014 Jan 28;8(1):642-9. doi: 10.1021/nn405249n. Epub 2013 Nov 26. ACS Nano. 2014. PMID: 24261695
Origin of Indium Diffusion in High-k Oxide HfO2.
Hu Y, Wang C, Dong H, Wallace RM, Cho K, Wang WH, Wang W. Hu Y, et al. Among authors: dong h. ACS Appl Mater Interfaces. 2016 Mar 23;8(11):7595-600. doi: 10.1021/acsami.6b01068. Epub 2016 Mar 10. ACS Appl Mater Interfaces. 2016. PMID: 26939534
Unusual oxidation-induced core-level shifts at the HfO2/InP interface.
Mäkelä J, Lahti A, Tuominen M, Yasir M, Kuzmin M, Laukkanen P, Kokko K, Punkkinen MPJ, Dong H, Brennan B, Wallace RM. Mäkelä J, et al. Among authors: dong h. Sci Rep. 2019 Feb 6;9(1):1462. doi: 10.1038/s41598-018-37518-2. Sci Rep. 2019. PMID: 30728385 Free PMC article.
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