Low-Frequency Noise Related to the Scattering Effect in p-Type Copper(I) Oxide Thin-Film Transistors.
Yoo J, Park S, Lee H, Lim S, Song H, Park M, Kim S, Jeong JH, Bong J, Heo K, Lee K, Kim T, Ye PD, Bae H.
Yoo J, et al. Among authors: song h.
ACS Appl Mater Interfaces. 2024 Dec 31. doi: 10.1021/acsami.4c14876. Online ahead of print.
ACS Appl Mater Interfaces. 2024.
PMID: 39740115