Risk factors for early replacement of cardiovascular implantable electronic devices.
Aizawa Y, Kunitomi A, Nakajima K, Kashimura S, Katsumata Y, Nishiyama T, Kimura T, Nishiyama N, Tanimoto Y, Kohsaka S, Takatsuki S, Fukuda K.
Aizawa Y, et al. Among authors: nishiyama t, nishiyama n.
Int J Cardiol. 2015 Jan 15;178:99-101. doi: 10.1016/j.ijcard.2014.10.157. Epub 2014 Oct 25.
Int J Cardiol. 2015.
PMID: 25464230
No abstract available.