Measurement of transient atomic displacements in thin films with picosecond and femtometer resolution.
Kozina M, Hu T, Wittenberg JS, Szilagyi E, Trigo M, Miller TA, Uher C, Damodaran A, Martin L, Mehta A, Corbett J, Safranek J, Reis DA, Lindenberg AM.
Kozina M, et al. Among authors: safranek j.
Struct Dyn. 2014 May 6;1(3):034301. doi: 10.1063/1.4875347. eCollection 2014 May.
Struct Dyn. 2014.
PMID: 26798776
Free PMC article.