The Schottky-Mott Rule Expanded for Two-Dimensional Semiconductors: Influence of Substrate Dielectric Screening.
Park S, Schultz T, Shin D, Mutz N, Aljarb A, Kang HS, Lee CH, Li LJ, Xu X, Tung V, List-Kratochvil EJW, Blumstengel S, Amsalem P, Koch N.
Park S, et al. Among authors: shin d.
ACS Nano. 2021 Sep 28;15(9):14794-14803. doi: 10.1021/acsnano.1c04825. Epub 2021 Aug 11.
ACS Nano. 2021.
PMID: 34379410
Free article.