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Low-energy electron potentiometry.
Jobst J, Kautz J, Mytiliniou M, Tromp RM, van der Molen SJ. Jobst J, et al. Among authors: tromp rm. Ultramicroscopy. 2017 Oct;181:74-80. doi: 10.1016/j.ultramic.2017.05.015. Epub 2017 May 13. Ultramicroscopy. 2017. PMID: 28527312
Reprint of Low-energy electron potentiometry.
Jobst J, Kautz J, Mytiliniou M, Tromp RM, van der Molen SJ. Jobst J, et al. Among authors: tromp rm. Ultramicroscopy. 2017 Dec;183:8-14. doi: 10.1016/j.ultramic.2017.10.009. Epub 2017 Oct 25. Ultramicroscopy. 2017. PMID: 29103783
Complementary LEEM and eV-TEM for imaging and spectroscopy.
Neu PS, Geelen D, Thete A, Tromp RM, van der Molen SJ. Neu PS, et al. Among authors: tromp rm. Ultramicroscopy. 2021 Mar;222:113199. doi: 10.1016/j.ultramic.2020.113199. Epub 2021 Jan 7. Ultramicroscopy. 2021. PMID: 33494037 Free article.
Imaging moiré deformation and dynamics in twisted bilayer graphene.
de Jong TA, Benschop T, Chen X, Krasovskii EE, de Dood MJA, Tromp RM, Allan MP, van der Molen SJ. de Jong TA, et al. Among authors: tromp rm. Nat Commun. 2022 Jan 10;13(1):70. doi: 10.1038/s41467-021-27646-1. Nat Commun. 2022. PMID: 35013349 Free PMC article.
117 results