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Size limits of magnetic-domain engineering in continuous in-plane exchange-bias prototype films.
Gaul A, Emmrich D, Ueltzhöffer T, Huckfeldt H, Doğanay H, Hackl J, Khan MI, Gottlob DM, Hartmann G, Beyer A, Holzinger D, Nemšák S, Schneider CM, Gölzhäuser A, Reiss G, Ehresmann A. Gaul A, et al. Among authors: huckfeldt h. Beilstein J Nanotechnol. 2018 Dec 3;9:2968-2979. doi: 10.3762/bjnano.9.276. eCollection 2018. Beilstein J Nanotechnol. 2018. PMID: 30591845 Free PMC article.