Taylor S - Search Results

1

Electrical Properties and Interfacial Studies of Hf_xTi_1-xO₂ High Permittivity Gate Insulators Deposited on Germanium Substrates.

Lu Q, Mu Y, Roberts JW, Althobaiti M, Dhanak VR, Wu J, Zhao C, Zhao CZ, Zhang Q, Yang L, Mitrovic IZ, Taylor S, Chalker PR. Lu Q, et al. Among authors: taylor s. Materials (Basel). 2015 Dec 2;8(12):8169-8182. doi: 10.3390/ma8125454. Materials (Basel). 2015. PMID: 28793705 Free PMC article.

2

Review on Non-Volatile Memory with High-k Dielectrics: Flash for Generation Beyond 32 nm.

Zhao C, Zhao CZ, Taylor S, Chalker PR. Zhao C, et al. Among authors: taylor s. Materials (Basel). 2014 Jul 15;7(7):5117-5145. doi: 10.3390/ma7075117. Materials (Basel). 2014. PMID: 28788122 Free PMC article. Review.

3

Hysteresis in Lanthanide Aluminum Oxides Observed by Fast Pulse CV Measurement.

Zhao C, Zhao CZ, Lu Q, Yan X, Taylor S, Chalker PR. Zhao C, et al. Among authors: taylor s. Materials (Basel). 2014 Oct 13;7(10):6965-6981. doi: 10.3390/ma7106965. Materials (Basel). 2014. PMID: 28788225 Free PMC article.

4

Hysteresis in Lanthanide Zirconium Oxides Observed Using a Pulse CV Technique and including the Effect of High Temperature Annealing.

Lu Q, Zhao C, Mu Y, Zhao CZ, Taylor S, Chalker PR. Lu Q, et al. Among authors: taylor s. Materials (Basel). 2015 Jul 29;8(8):4829-4842. doi: 10.3390/ma8084829. Materials (Basel). 2015. PMID: 28793475 Free PMC article.

5

Extrinsic and Intrinsic Frequency Dispersion of High-k Materials in Capacitance-Voltage Measurements.

Tao J, Zhao CZ, Zhao C, Taechakumput P, Werner M, Taylor S, Chalker PR. Tao J, et al. Among authors: taylor s. Materials (Basel). 2012 Jun 1;5(6):1005-1032. doi: 10.3390/ma5061005. Materials (Basel). 2012. PMID: 28817021 Free PMC article. Review.

6

Grain size dependence of dielectric relaxation in cerium oxide as high-k layer.

Zhao C, Zhao CZ, Werner M, Taylor S, Chalker P, King P. Zhao C, et al. Among authors: taylor s. Nanoscale Res Lett. 2013 Apr 15;8(1):172. doi: 10.1186/1556-276X-8-172. Nanoscale Res Lett. 2013. PMID: 23587419 Free PMC article.

7

Dielectric Relaxation of La-Doped Zirconia Caused by Annealing Ambient.

Zhao CZ, Werner M, Taylor S, Chalker PR, Jones AC, Zhao C. Zhao CZ, et al. Among authors: taylor s. Nanoscale Res Lett. 2011 Dec;6(1):48. doi: 10.1007/s11671-010-9782-z. Epub 2010 Sep 30. Nanoscale Res Lett. 2011. PMID: 27502670 Free PMC article.

8

Dielectric relaxation of high-k oxides.

Zhao C, Zhao CZ, Werner M, Taylor S, Chalker P. Zhao C, et al. Among authors: taylor s. Nanoscale Res Lett. 2013 Nov 1;8(1):456. doi: 10.1186/1556-276X-8-456. Nanoscale Res Lett. 2013. PMID: 24180696 Free PMC article.

9

Linear ion trap fabricated using rapid manufacturing technology.

Clare AT, Gao L, Brkić B, Chalker PR, Taylor S. Clare AT, et al. Among authors: taylor s. J Am Soc Mass Spectrom. 2010 Feb;21(2):317-22. doi: 10.1016/j.jasms.2009.10.020. Epub 2009 Nov 5. J Am Soc Mass Spectrom. 2010. PMID: 19962322 Free article.

10

Development of quadrupole mass spectrometers using rapid prototyping technology.

Brkić B, France N, Clare AT, Sutcliffe CJ, Chalker PR, Taylor S. Brkić B, et al. Among authors: taylor s. J Am Soc Mass Spectrom. 2009 Jul;20(7):1359-65. doi: 10.1016/j.jasms.2009.03.025. Epub 2009 Apr 5. J Am Soc Mass Spectrom. 2009. PMID: 19409811 Free article.

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