Top-down patterning of topological surface and edge states using a focused ion beam.
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Bake A, et al. Among authors: valanoor n.
Nat Commun. 2023 Mar 27;14(1):1693. doi: 10.1038/s41467-023-37102-x.
Nat Commun. 2023.
PMID: 36973266
Free PMC article.