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Page 1
Weakly Trapped, Charged, and Free Excitons in Single-Layer MoS2 in the Presence of Defects, Strain, and Charged Impurities.
Dubey S, Lisi S, Nayak G, Herziger F, Nguyen VD, Le Quang T, Cherkez V, González C, Dappe YJ, Watanabe K, Taniguchi T, Magaud L, Mallet P, Veuillen JY, Arenal R, Marty L, Renard J, Bendiab N, Coraux J, Bouchiat V. Dubey S, et al. Among authors: nayak g. ACS Nano. 2017 Nov 28;11(11):11206-11216. doi: 10.1021/acsnano.7b05520. Epub 2017 Oct 18. ACS Nano. 2017. PMID: 28992415
Correction to Weakly Trapped, Charged, and Free Excitons in Single-Layer MoS2 in the Presence of Defects, Strain, and Charged Impurities.
Dubey S, Lisi S, Nayak G, Herziger F, Nguyen VD, Le Quang T, Cherkez V, González C, Dappe YJ, Watanabe K, Taniguchi T, Magaud L, Mallet P, Veuillen JY, Arenal R, Marty L, Renard J, Bendiab N, Coraux J, Bouchiat V. Dubey S, et al. Among authors: nayak g. ACS Nano. 2018 Oct 23;12(10):10565-10566. doi: 10.1021/acsnano.8b07086. Epub 2018 Sep 20. ACS Nano. 2018. PMID: 30234967 No abstract available.
Evolution of inter-layer coupling in artificially stacked bilayer MoS2.
Sarkar S, Pradeepa HL, Nayak G, Marty L, Renard J, Coraux J, Bendiab N, Bouchiat V, Basu JK, Bid A. Sarkar S, et al. Among authors: nayak g. Nanoscale Adv. 2019 Oct 2;1(11):4398-4405. doi: 10.1039/c9na00517j. eCollection 2019 Nov 5. Nanoscale Adv. 2019. PMID: 36134393 Free PMC article.
A tunable Fabry-Pérot quantum Hall interferometer in graphene.
Déprez C, Veyrat L, Vignaud H, Nayak G, Watanabe K, Taniguchi T, Gay F, Sellier H, Sacépé B. Déprez C, et al. Among authors: nayak g. Nat Nanotechnol. 2021 May;16(5):555-562. doi: 10.1038/s41565-021-00847-x. Epub 2021 Feb 25. Nat Nanotechnol. 2021. PMID: 33633403 Free PMC article.
Human relevant frontiers in drug safety and efficacy.
Mahadik K, Visala A, Chatterjee N, Pahuja M, Mehta V, Dhurde T, Nayak G, Ahmed T, Devireddy N, Krishnan A, Viswanathan K, Gandhi S, Mehta G, Karmwar P, Paleja B, Mohanty S, Parvatam S, Pallela R, Rao M. Mahadik K, et al. Among authors: nayak g. ALTEX. 2025;42(1):146-151. doi: 10.14573/altex.2411131. ALTEX. 2025. PMID: 39817836 Free article. No abstract available.
Author Correction: Improved oxidation behavior of Hf0.11Al0.20B0.69 in comparison to Hf0.28B0.72 magnetron sputtered thin films.
Kümmerl P, Lellig S, Navidi Kashani AH, Hans M, Pöllmann PJ, Löfler L, Nayak GK, Holzapfel DM, Kolozsvári S, Polcik P, Schweizer P, Primetzhofer D, Michler J, Schneider JM. Kümmerl P, et al. Among authors: nayak gk. Sci Rep. 2024 Oct 24;14(1):25223. doi: 10.1038/s41598-024-75854-8. Sci Rep. 2024. PMID: 39448740 Free PMC article. No abstract available.
187 results