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Exploring topological defects in epitaxial BiFeO3 thin films.
Vasudevan RK, Chen YC, Tai HH, Balke N, Wu P, Bhattacharya S, Chen LQ, Chu YH, Lin IN, Kalinin SV, Nagarajan V. Vasudevan RK, et al. ACS Nano. 2011 Feb 22;5(2):879-87. doi: 10.1021/nn102099z. Epub 2011 Jan 7. ACS Nano. 2011. PMID: 21214267
Domain wall geometry controls conduction in ferroelectrics.
Vasudevan RK, Morozovska AN, Eliseev EA, Britson J, Yang JC, Chu YH, Maksymovych P, Chen LQ, Nagarajan V, Kalinin SV. Vasudevan RK, et al. Nano Lett. 2012 Nov 14;12(11):5524-31. doi: 10.1021/nl302382k. Epub 2012 Sep 27. Nano Lett. 2012. PMID: 22994244
84 results