Ptychographic X-ray speckle tracking with multi-layer Laue lens systems.
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J Appl Crystallogr. 2020 Jul 8;53(Pt 4):927-936. doi: 10.1107/S1600576720006925. eCollection 2020 Aug 1.
J Appl Crystallogr. 2020.
PMID: 32788900
Free PMC article.