Toivanen V - Search Results

1

Charge breeding at GANIL: Improvements, results, and comparison with the other facilities.

Maunoury L, Dubois M, Delahaye P, Annaluru A, Bajeat O, Frigot R, Hormigos S, Jacquot B, Jardin P, Osmond B, Predrag U, Retailleau BM, Savalle A, Toivanen V, Thomas JC, Angot J, Sole P, Lamy T, Koivisto H, Marttinen M, Tarvainen O. Maunoury L, et al. Among authors: toivanen v. Rev Sci Instrum. 2020 Feb 1;91(2):023315. doi: 10.1063/1.5128661. Rev Sci Instrum. 2020. PMID: 32113428

2

Ion beam development for the needs of the JYFL nuclear physics programme.

Koivisto H, Suominen P, Ropponen T, Ropponen J, Koponen T, Savonen M, Toivanen V, Wu X, Machicoane G, Stetson J, Zavodszky P, Doleans M, Spädtke P, Vondrasek R, Tarvainen O. Koivisto H, et al. Among authors: toivanen v. Rev Sci Instrum. 2008 Feb;79(2 Pt 2):02A303. doi: 10.1063/1.2804866. Rev Sci Instrum. 2008. PMID: 18315093

3

The effect of rf pulse pattern on bremsstrahlung and ion current time evolution of an ECRIS.

Ropponen T, Tarvainen O, Toivanen V, Peura P, Jones P, Kalvas T, Koivisto H, Noland J, Leitner D. Ropponen T, et al. Among authors: toivanen v. Rev Sci Instrum. 2010 Feb;81(2):02A302. doi: 10.1063/1.3258611. Rev Sci Instrum. 2010. PMID: 20192323

4

The role of seed electrons on the plasma breakdown and preglow of electron cyclotron resonance ion source.

Tarvainen O, Ropponen T, Thuillier T, Noland J, Toivanen V, Kalvas T, Koivisto H. Tarvainen O, et al. Among authors: toivanen v. Rev Sci Instrum. 2010 Feb;81(2):02A303. doi: 10.1063/1.3257974. Rev Sci Instrum. 2010. PMID: 20192324

5

Effect of electron cyclotron resonance ion source frequency tuning on ion beam intensity and quality at Department of Physics, University of Jyväskylä.

Toivanen V, Koivisto H, Steczkiewicz O, Celona L, Tarvainen O, Ropponen T, Gammino S, Mascali D, Ciavola G. Toivanen V, et al. Rev Sci Instrum. 2010 Feb;81(2):02A319. doi: 10.1063/1.3267287. Rev Sci Instrum. 2010. PMID: 20192340

6

Electron cyclotron resonance ion source plasma chamber studies using a network analyzer as a loaded cavity probe.

Toivanen V, Tarvainen O, Lyneis C, Kauppinen J, Komppula J, Koivisto H. Toivanen V, et al. Rev Sci Instrum. 2012 Feb;83(2):02A306. doi: 10.1063/1.3660818. Rev Sci Instrum. 2012. PMID: 22380153

7

The effect of gas mixing and biased disc voltage on the preglow transient of electron cyclotron resonance ion source.

Tarvainen O, Toivanen V, Komppula J, Kalvas T, Koivisto H. Tarvainen O, et al. Among authors: toivanen v. Rev Sci Instrum. 2012 Feb;83(2):02A314. doi: 10.1063/1.3663222. Rev Sci Instrum. 2012. PMID: 22380161

8

Transverse distribution of beam current oscillations of a 14 GHz electron cyclotron resonance ion source.

Tarvainen O, Toivanen V, Komppula J, Kalvas T, Koivisto H. Tarvainen O, et al. Among authors: toivanen v. Rev Sci Instrum. 2014 Feb;85(2):02A909. doi: 10.1063/1.4826539. Rev Sci Instrum. 2014. PMID: 24593488

9

Ionization efficiency studies with charge breeder and conventional electron cyclotron resonance ion source.

Koivisto H, Tarvainen O, Toivanen V, Komppula J, Kronholm R, Lamy T, Angot J, Delahaye P, Maunoury L, Galata A, Patti G, Standylo L, Steczkiewicz O, Choinski J. Koivisto H, et al. Among authors: toivanen v. Rev Sci Instrum. 2014 Feb;85(2):02B917. doi: 10.1063/1.4854215. Rev Sci Instrum. 2014. PMID: 24593622

10

Limitation of the ECRIS performance by kinetic plasma instabilities (invited).

Tarvainen O, Kalvas T, Koivisto H, Komppula J, Kronholm R, Laulainen J, Izotov I, Mansfeld D, Skalyga V, Toivanen V, Machicoane G. Tarvainen O, et al. Among authors: toivanen v. Rev Sci Instrum. 2016 Feb;87(2):02A703. doi: 10.1063/1.4931716. Rev Sci Instrum. 2016. PMID: 26931921

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