X-ray backlighter requirements for refraction-based electron density diagnostics through Talbot-Lau deflectometry.
Valdivia MP, Veloso F, Stutman D, Stoeckl C, Mileham C, Begishev IA, Theobald W, Vescovi M, Useche W, Regan SP, Albertazzi B, Rigon G, Mabey P, Michel T, Pikuz SA, Koenig M, Casner A.
Valdivia MP, et al. Among authors: stutman d.
Rev Sci Instrum. 2018 Oct;89(10):10G127. doi: 10.1063/1.5039342.
Rev Sci Instrum. 2018.
PMID: 30399908